X-ray cross-profile measurement with PSYSTEME
Range selection of x-ray energy guarantees maximum performance.
PSYSTEME high-speed, ultra-low-noise thickness gauges are excellent suited for measuring 'static' and 'dynamic' cross-profiles of strips.
Therefore the C-frame traverses across the width using a rack and pinion drive with an AC-controlled motor. Outstanding dynamic profiles are obtained with the "Dual-Profiling-Solution" by adding a fixed centre line thickness gauge to compensate thickness changes in strip travel direction.
PSYSTEME adapts the energy of the X-ray beam to the measuring range and obtains clear low-noise profiles which do not need any further arithmetic signal filtering.
Fast data processing and a real-time operating system guarantee excellent profiles for high-speed production lines.
Technical details:
| • Measurement range: | 0.05 - 50 mm |
| • Accuracy: | < 0.1 % |
| • Noise: | < +/- 0.075 % |
| • Time constant: | < 1 ms |
| • Sampling rate: | 2000 Hz |
| • Drift: | < 0.02 % / 24h |
| • System availability: | > 99.8 % |
| • Traversing speed: | up to 400 mm/s |
| • Strip speed: | up to 25 m/s |